Easy axis orientation mapping and application to the development of MR films

Easy axis orientation (EAO) measurement should be convenient way to characterize magnetic films for MR heads. However, the practical application was limited because of the complexity of EAO measurements. Here we clarify the EAO measurement condition by calculation and experiments. Then we show an ex...

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Bibliographic Details
Published in:IEEE transactions on magnetics 1999-09, Vol.35 (5), p.3949-3951
Main Authors: Imagawa, T., Tajima, Y., Mitsuoka, K.
Format: Article
Language:English
Subjects:
Applied sciences
Coils
Complexity
Electronics
Exact sciences and technology
Kerr effect
Magnetic devices
Magnetic field measurement
Magnetic films
Magnetic heads
Magnetic switching
Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.)
domain-motion devices, etc
Magnetization
Mapping
Mathematical analysis
Orientation
Production
Rotation measurement
Semiconductor device modeling
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Wafers
Citations: Items that this one cites
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Description
Summary:Easy axis orientation (EAO) measurement should be convenient way to characterize magnetic films for MR heads. However, the practical application was limited because of the complexity of EAO measurements. Here we clarify the EAO measurement condition by calculation and experiments. Then we show an example of EAO application to the development of MR films and identify an important parameter for wafer production.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.800718