X-ray diffraction line profile analysis of mechanically alloyed nanocrystalline YSZ

• Published in: Journal of physics. D, Applied physics Applied physics, 2008-02, Vol.41 (4), p.045408-045408 (6)
• Main Authors: DURA, O. J, LOPEZ DE LA TORRE, M. A
• Format: Article
• Language: English
• Subjects: Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Materials science; Nanocrystalline materials; Nanoscale materials and structures: fabrication and characterization; Physics
• ISSN: 0022-3727; 1361-6463
• DOI: 10.1088/0022-3727/41/4/045408

In this work we present a microstructural study of nanocrystalline 8%- and 10%-yttria stabilized zirconia obtained by means of mechanical alloying. Line profile analysis of the XRD patterns, using Warren-Averbach (WA), Williamson-Hall (WH) and Scherrer methods, was systematically used to obtain values of grain size and microstrain. Although the WH and WA methods give similar values for grain size, the WA method is more appropriate because of its better performance on the calculation of microstrain. Our results indicate that the as-milled powders consist of a mixture of a nanocrystalline phase (grain size d = O(10 nm)) plus an amorphous-like minority phase, very likely located in the intergranular region. Two-step sintering treatments of samples compacted at 1 GPa resulted in moderate grain growth (d < = 120 nm), the relief of the internal stresses, and the disappearance of the amorphous-like phase. We conclude that mechanical alloying followed by a two-step sintering method is a valid option to obtain nanocrystalline YSZ compacts with densities above 92% of the theoretical value.