Soft-error resilience of the IBM POWER6 processor input/output subsystem: Soft errors in circuits and systems

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Bibliographic Details
Published in:IBM journal of research and development 2008, Vol.52 (3), p.285-292
Main Authors: BENDER, C, SANDA, P. N, KUDVA, P, MATA, R, POKALA, V, HARADEN, R, SCHALLHORN, M
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Integrated circuits
Integrated circuits by function (including memories and processors)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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ISSN:0018-8646