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DC and Transient Performance of 4H-SiC Double-Implant MOSFETs : Silicon carbide devices and technology
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Published in: | IEEE transactions on electron devices 2008, Vol.55 (8), p.1824-1829 |
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Main Authors: | , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0018-9383 1557-9646 |