Mesoporous Silicate Film Growth at the Air−Water InterfaceDirect Observation by X-ray Reflectivity

Templated silicate films with mesoporous structure on the scale of 40 Å grow at the air−water interface of concentrated surfactant solutions. X-ray reflectivity measurements show that the mechanism of this growth for our preparation involves two stagesthe formation of an organized surfactant layer...

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Bibliographic Details
Published in:Langmuir 1997-11, Vol.13 (24), p.6363-6365
Main Authors: Brown, A. S, Holt, S. A, Dam, Thien, Trau, M, White, J. W
Format: Article
Language:English
Subjects:
Chemistry
Exact sciences and technology
Gas-liquid interface and liquid-liquid interface
General and physical chemistry
Surface physical chemistry
Online Access:Get full text
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Summary:Templated silicate films with mesoporous structure on the scale of 40 Å grow at the air−water interface of concentrated surfactant solutions. X-ray reflectivity measurements show that the mechanism of this growth for our preparation involves two stagesthe formation of an organized surfactant layer at the interface in the first 10 h and the subsequent rapid growth of a structure which shows strong diffraction associated with the mesoporous repeat distance. The structure appears to grow when the interfacial layer is complete with a thickness of about 30 Å.
ISSN:0743-7463
1520-5827
DOI:10.1021/la970832j