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Nanoscale inclusions in the phonon glass thermoelectric material Zn4Sb3

We have investigated the thermoelectric material Zn 4 Sb 3 using transmission electron microscopy (TEM). Nanoscale inclusions with a diameter of about 10 nm were observed, constituting on the order of 1% by volume of the material. Studies using energy filtered imaging, electron diffraction, and high...

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Bibliographic Details
Published in:Philosophical magazine letters 2009-06, Vol.89 (6), p.362-369
Main Authors: Prytz, Ø., Gunnæs, A.E., Karlsen, O.B., Breivik, T.H., Toberer, E.S., Jeffrey Snyder, G., Taftø, J.
Format: Article
Language:English
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Summary:We have investigated the thermoelectric material Zn 4 Sb 3 using transmission electron microscopy (TEM). Nanoscale inclusions with a diameter of about 10 nm were observed, constituting on the order of 1% by volume of the material. Studies using energy filtered imaging, electron diffraction, and high-angle annular dark-field STEM indicate that the inclusions consist of Zn. These inclusions are expected to scatter the medium and long-wavelength phonons effectively, thus contributing to phonon glass behavior which results in the exceptionally low thermal conductivity for this thermoelectric material.
ISSN:0950-0839
1362-3036
DOI:10.1080/09500830902950464