Experimental Study of the Effect of Flux Trapping on the Operation of RSFQ Circuits

This paper investigates the robustness of different ground plane configurations of superconducting circuits against magnetic flux trapping. The robustness of the circuit is determined by the change of the error rate at a specific operating point under the influence of an external magnetic field. A l...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2009-06, Vol.19 (3), p.607-610
Main Authors: Ebert, B., Ortlepp, T., Uhlmann, F.H.
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Circuits
Critical current
Design. Technologies. Operation analysis. Testing
Digital circuits
Electric, optical and optoelectronic circuits
Electrical engineering. Electrical power engineering
Electromagnets
Electronic circuits
Electronics
Error analysis
Error rate measurements
Exact sciences and technology
Ground plane
Integrated circuits
Josephson junction
Josephson junctions
Magnetic circuits
Magnetic field measurement
Magnetic fields
Magnetic shielding
Permissible error
Robustness
RSFQ
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Statistics
superconducting circuits
Superconducting devices
Superconductivity
trapped flux
Trapping
Type II superconductors
Various equipment and components
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Summary:This paper investigates the robustness of different ground plane configurations of superconducting circuits against magnetic flux trapping. The robustness of the circuit is determined by the change of the error rate at a specific operating point under the influence of an external magnetic field. A large number of thermocycles are used to determine the statistic properties of the error rate. The proposed measurement setup allows a fast scan of a two-dimensional operating area.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2009.2018738