Optical properties of thin films of system (As 2Se 3) 80− x (As 2Te 3) x (SnTe) 20 prepared by PLD

• Published in: Journal of non-crystalline solids 2009-10, Vol.355 (37), p.1955-1958
• Main Authors: Parchanski, V., Frumarová, B., Frumar, M., Hrdlička, M., Pavlišta, M., Vlček, Mil
• Format: Article
• Language: English
• Subjects: Amorphous semiconductors; glasses; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Ellipsometry; Exact sciences and technology; Laser deposition; Non-linear optics; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Optical spectroscopy; Physics
• ISSN: 0022-3093; 1873-4812
• DOI: 10.1016/j.jnoncrysol.2009.06.022

Thin amorphous films from system (As 2Se 3) 80− x (As 2Te 3) x (SnTe) 20 were prepared by pulsed laser deposition (PLD) from their bulk glasses and their optical properties were studied by spectral ellipsometry. Spectral dependencies of refractive index, absorption and extinction coefficient and optical gap (1.41–1.66 eV for (As 2Se 3) 80− x (As 2Te 3) x (SnTe) 20 with x = 20 resp. x = 0) were calculated from optical tansmittance, from ellipsometric data by Tauc method. High values of refractive index n 0 (2.49–2.60) and of non-linear χ (3) coefficient of index of refraction (4.9–7.5 × 10 −12 esu for the glass (As 2Se 3) 80− x (As 2Te 3) x (SnTe) 20 with x = 0 resp. x = 20) made studied thin films of system (As 2Se 3) 80− x (As 2Te 3) x (SnTe) 20 promising candidates for application in optics and optoelectronics.