CDM tests on interface test chips for the verification of ESD protection concepts : Electrostatic Discharge Reliability

Saved in:
Bibliographic Details
Main Authors: BRODBECK, Tilo, ESMARK, Kai, STADLER, Wolfgang
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0026-2714
1872-941X