A comprehensive system for submicron-device simulation

We present here a comprehensive system for submicron-device simulation based on the hydrodynamic (HD) model and the expansion of the Boltzmann equation (BTE) in spherical harmonics (SHE). In the typical operating regime of semiconductor devices, the accurate calculation of the carrier concentration...

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Main Authors: Rudan, M., Lorenzini, M., Vecchi, M.C., Reggiani, S.
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Brillouin scattering
Design. Technologies. Operation analysis. Testing
Electronics
Electrons
Equations
Exact sciences and technology
Hydrodynamics
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Tensile stress
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creator Rudan, M.
Lorenzini, M.
Vecchi, M.C.
Reggiani, S.
description We present here a comprehensive system for submicron-device simulation based on the hydrodynamic (HD) model and the expansion of the Boltzmann equation (BTE) in spherical harmonics (SHE). In the typical operating regime of semiconductor devices, the accurate calculation of the carrier concentration and velocity, along with the information about the carrier temperature, provided by the HD model, is important for describing a number of phenomena indicated by the general term hot-carrier effects, which play a relevant role in modern devices. The coefficients of the model are computed by adopting the solution method for the BTE based on the SHE, and using the full-band structure for both the electron and valence band of silicon. The dependence of the coefficients on lattice temperature has been investigated and compared with available experimental data.
doi_str_mv 10.1109/ICMEL.1997.625177
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subjects Applied sciences
Brillouin scattering
Design. Technologies. Operation analysis. Testing
Electronics
Electrons
Equations
Exact sciences and technology
Hydrodynamics
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Tensile stress
title A comprehensive system for submicron-device simulation
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