Bulk Sensitive Soft X-ray Angle-Resolved Photoemission Spectroscopy of Bi1.72Pb0.38Sr1.88CuO6+\delta

• Published in: Journal of the Physical Society of Japan 2010-06, Vol.79 (6), p.064711-064711-6
• Main Authors: Takeuchi, Tsunehiro, Hamaya, Yoichiro, Ikuta, Hiroshi, Ohkochi, Takuo, Fujimori, Shin-ichi, Saitoh, Yuji
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Physics; Properties of type I and type II superconductors; Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.); Superconductivity
• ISSN: 0031-9015; 1347-4073
• DOI: 10.1143/JPSJ.79.064711

Electronic structure of heavily over-doped Bi 1.72 Pb 0.38 Sr 1.88 CuO 6+\delta (Bi2201) superconductor was investigated by using the angle-resolved photoemission spectroscopy with soft x-ray as the incident photon source (SX-ARPES), which is known as one of the best bulk sensitive experimental techniques to investigate the electronic structure. By using the Cu 2 p --3 d resonance condition, we succeeded in determining the energy--momentum dispersion near the Fermi level and the Fermi surface. It is clearly shown that both SX- and VUV-ARPES are capable of determining the energy--momentum dispersion near $\varepsilon_{\text{F}}$ at least for the homologous series of Bi 2 Sr 2 Ca n Cu n+1 O 6+2n+\delta cuprate superconductors, and that the combinational use of SX- and VUV-ARPES is one of the best experimental methods to determine the electronic structure of bulk materials.