Loading…

The measurement of relative complex dielectric constant by means of an automatic slotted-line system

Saved in:
Bibliographic Details
Published in:International journal of infrared and millimeter waves 1998-05, Vol.19 (5), p.755-769
Main Authors: ZHISHENG LIN, HAITAU LIN, HONGXIONG WU, CHUHUA PAN, YULIANG LONG
Format: Article
Language:English
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0195-9271
1572-9559
DOI:10.1023/A:1022654526836