The measurement of relative complex dielectric constant by means of an automatic slotted-line system

Saved in:
Bibliographic Details
Published in:International journal of infrared and millimeter waves 1998-05, Vol.19 (5), p.755-769
Main Authors: ZHISHENG LIN, HAITAU LIN, HONGXIONG WU, CHUHUA PAN, YULIANG LONG
Format: Article
Language:English
Subjects:
Exact sciences and technology
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 769
container_issue 5
container_start_page 755
container_title International journal of infrared and millimeter waves
container_volume 19
creator ZHISHENG LIN
HAITAU LIN
HONGXIONG WU
CHUHUA PAN
YULIANG LONG
description
doi_str_mv 10.1023/A:1022654526836
format article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_2326256</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2326256</sourcerecordid><originalsourceid>FETCH-LOGICAL-p182t-ff9b635baf3f9d0bc99e5959580f14dbad3b13b4e0089d7d78aef4c60a16feac3</originalsourceid><addsrcrecordid>eNotjEtLxDAUhYMoWEfXbrNwW82jSRt3w-ALBtyM6-EmucFK0pYmI86_t4NyFh8czncIueXsnjMhH9aPC4RWjRK6k_qMVFy1ojZKmXNSMW5UbUTLL8lVzl-MMdN2bUX87hNpQsiHGRMOhY6Bzhih9N9I3ZimiD_U9xjRlbl3SzXkAsvOHk_akE8CDBQOZUyL5WiOYyno69gPSPMxF0zX5CJAzHjzzxX5eH7abV7r7fvL22a9rSfeiVKHYKyWykKQwXhmnTGozJKOBd54C15aLm2DjHXGt77tAEPjNAOuA4KTK3L39ztBdhDDDIPr836a-wTzcS-k0EJp-QtNHlsD</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The measurement of relative complex dielectric constant by means of an automatic slotted-line system</title><source>Springer Nature</source><creator>ZHISHENG LIN ; HAITAU LIN ; HONGXIONG WU ; CHUHUA PAN ; YULIANG LONG</creator><creatorcontrib>ZHISHENG LIN ; HAITAU LIN ; HONGXIONG WU ; CHUHUA PAN ; YULIANG LONG</creatorcontrib><identifier>ISSN: 0195-9271</identifier><identifier>EISSN: 1572-9559</identifier><identifier>DOI: 10.1023/A:1022654526836</identifier><identifier>CODEN: IJIWDO</identifier><language>eng</language><publisher>New York, NY: Kluwer Academic/Plenum</publisher><subject>Exact sciences and technology ; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Physics</subject><ispartof>International journal of infrared and millimeter waves, 1998-05, Vol.19 (5), p.755-769</ispartof><rights>1998 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=2326256$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ZHISHENG LIN</creatorcontrib><creatorcontrib>HAITAU LIN</creatorcontrib><creatorcontrib>HONGXIONG WU</creatorcontrib><creatorcontrib>CHUHUA PAN</creatorcontrib><creatorcontrib>YULIANG LONG</creatorcontrib><title>The measurement of relative complex dielectric constant by means of an automatic slotted-line system</title><title>International journal of infrared and millimeter waves</title><subject>Exact sciences and technology</subject><subject>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><issn>0195-9271</issn><issn>1572-9559</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNotjEtLxDAUhYMoWEfXbrNwW82jSRt3w-ALBtyM6-EmucFK0pYmI86_t4NyFh8czncIueXsnjMhH9aPC4RWjRK6k_qMVFy1ojZKmXNSMW5UbUTLL8lVzl-MMdN2bUX87hNpQsiHGRMOhY6Bzhih9N9I3ZimiD_U9xjRlbl3SzXkAsvOHk_akE8CDBQOZUyL5WiOYyno69gPSPMxF0zX5CJAzHjzzxX5eH7abV7r7fvL22a9rSfeiVKHYKyWykKQwXhmnTGozJKOBd54C15aLm2DjHXGt77tAEPjNAOuA4KTK3L39ztBdhDDDIPr836a-wTzcS-k0EJp-QtNHlsD</recordid><startdate>19980501</startdate><enddate>19980501</enddate><creator>ZHISHENG LIN</creator><creator>HAITAU LIN</creator><creator>HONGXIONG WU</creator><creator>CHUHUA PAN</creator><creator>YULIANG LONG</creator><general>Kluwer Academic/Plenum</general><scope>IQODW</scope></search><sort><creationdate>19980501</creationdate><title>The measurement of relative complex dielectric constant by means of an automatic slotted-line system</title><author>ZHISHENG LIN ; HAITAU LIN ; HONGXIONG WU ; CHUHUA PAN ; YULIANG LONG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p182t-ff9b635baf3f9d0bc99e5959580f14dbad3b13b4e0089d7d78aef4c60a16feac3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Exact sciences and technology</topic><topic>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHISHENG LIN</creatorcontrib><creatorcontrib>HAITAU LIN</creatorcontrib><creatorcontrib>HONGXIONG WU</creatorcontrib><creatorcontrib>CHUHUA PAN</creatorcontrib><creatorcontrib>YULIANG LONG</creatorcontrib><collection>Pascal-Francis</collection><jtitle>International journal of infrared and millimeter waves</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ZHISHENG LIN</au><au>HAITAU LIN</au><au>HONGXIONG WU</au><au>CHUHUA PAN</au><au>YULIANG LONG</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The measurement of relative complex dielectric constant by means of an automatic slotted-line system</atitle><jtitle>International journal of infrared and millimeter waves</jtitle><date>1998-05-01</date><risdate>1998</risdate><volume>19</volume><issue>5</issue><spage>755</spage><epage>769</epage><pages>755-769</pages><issn>0195-9271</issn><eissn>1572-9559</eissn><coden>IJIWDO</coden><cop>New York, NY</cop><pub>Kluwer Academic/Plenum</pub><doi>10.1023/A:1022654526836</doi><tpages>15</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0195-9271
ispartof International journal of infrared and millimeter waves, 1998-05, Vol.19 (5), p.755-769
issn 0195-9271
1572-9559
language eng
recordid cdi_pascalfrancis_primary_2326256
source Springer Nature
subjects Exact sciences and technology
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
title The measurement of relative complex dielectric constant by means of an automatic slotted-line system
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T04%3A33%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20measurement%20of%20relative%20complex%20dielectric%20constant%20by%20means%20of%20an%20automatic%20slotted-line%20system&rft.jtitle=International%20journal%20of%20infrared%20and%20millimeter%20waves&rft.au=ZHISHENG%20LIN&rft.date=1998-05-01&rft.volume=19&rft.issue=5&rft.spage=755&rft.epage=769&rft.pages=755-769&rft.issn=0195-9271&rft.eissn=1572-9559&rft.coden=IJIWDO&rft_id=info:doi/10.1023/A:1022654526836&rft_dat=%3Cpascalfrancis%3E2326256%3C/pascalfrancis%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p182t-ff9b635baf3f9d0bc99e5959580f14dbad3b13b4e0089d7d78aef4c60a16feac3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true