Loading…

Electromagnetic Compatibility Benchmark-Modeling Approach for a Dual-Die CPU

The traditional challenging problem 2000-4 of electromagnetics (as indicated by the IEEE) proposed a benchmark model of a conventional CPU with a heatsink. However, after CPU entered the multiple-die century, the original model is no longer effective for the new generation multiple-die package. A no...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on electromagnetic compatibility 2011-02, Vol.53 (1), p.91-98
Main Authors: Zhu, Boyuan, Lu, Junwei, Li, Erping
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The traditional challenging problem 2000-4 of electromagnetics (as indicated by the IEEE) proposed a benchmark model of a conventional CPU with a heatsink. However, after CPU entered the multiple-die century, the original model is no longer effective for the new generation multiple-die package. A novel model is proposed in this paper for electromagnet radiation modeling of the CPU with dual dies as a new electromagnetic compatibility benchmark-modeling approach. The modeling method is validated by the measurement, and the simulation and measurement results showed a good agreement, and demonstrated it is an effective modeling technique.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2010.2053208