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Impact of Ge―Sb―Te compound engineering on the set operation performance in phase-change memories: Special Issue Devoted to the 2nd International Memory Workshop (IMW 2010)
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Published in: | Solid-state electronics 2011, Vol.58 (1), p.11-16 |
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Main Authors: | , , , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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ISSN: | 0038-1101 1879-2405 |