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Impact of Ge―Sb―Te compound engineering on the set operation performance in phase-change memories: Special Issue Devoted to the 2nd International Memory Workshop (IMW 2010)

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Bibliographic Details
Published in:Solid-state electronics 2011, Vol.58 (1), p.11-16
Main Authors: BONIARDI, Mattia, IELMINI, Daniele, VARESI, Enrico, PELLIZZER, Fabio, LACAITA, Andrea L, BEZ, Roberto, TORTORELLI, Innocenzo, REDAELLI, Andrea, PIROVANO, Agostino, ALLEGRA, Mario, MAGISTRETTI, Michele, BRESOLIN, Camillo, ERBETTA, Davide, MODELLI, Alberto
Format: Article
Language:English
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ISSN:0038-1101
1879-2405