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A study of the switching mechanism and electrode material of fully CMOS compatible tungsten oxide ReRAM: Memristive and Resistive Devices and Systems

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2011, Vol.102 (4), p.901-907
Main Authors: CHIEN, W. C, CHEN, Y. C, LEE, M. H, SHIH, Y. H, HSIEH, K. Y, LU, Chih-Yuan, LAI, E. K, LEE, F. M, LIN, Y. Y, CHUANG, Alfred T. H, CHANG, K. P, YAO, Y. D, CHOU, T. H, LIN, H. M
Format: Article
Language:English
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ISSN:0947-8396
1432-0630