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Electron logic devices and nanoinstrumentation based on laterally patterned interaction-free quantum measurement structures

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Bibliographic Details
Published in:Semiconductor science and technology 1998-08, Vol.13 (8A), p.A93-A96
Main Author: Barker, J R
Format: Article
Language:English
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/13/8A/028