Image simulation of a corrugated surface in the constant-force-gradient mode of the scanning force microscope

A simple numerical method allowing one to simulate the imaging process in the non-contact mode of the scanning force microscope in the case of a pyramidal tip interacting with a corrugated surface is presented. The attractive van der Waals and repulsive forces are described by a Lennard-Jones-type p...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 1998-10, Vol.31 (19), p.2388-2394
Main Authors: Touhari-Kouko, F, Bouju, X, Devel, M, Cohen-Solal, G
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Physics
Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
Solid surfaces and solid-solid interfaces
Structure of solids and liquids
crystallography
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:A simple numerical method allowing one to simulate the imaging process in the non-contact mode of the scanning force microscope in the case of a pyramidal tip interacting with a corrugated surface is presented. The attractive van der Waals and repulsive forces are described by a Lennard-Jones-type potential in order to study the image of nanostructures in the constant-height and constant-force-gradient modes. The influence of the tip's shape is demonstrated and the notion of resolution is discussed for both modes. We also analyse the consequences of the chemical natures of the nanostructures and the substrate for the image. Materials studied include MgO, Ag and Au.
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/31/19/005