Nano-size magnetic crystallite formation in Co-Cr thin films for perpendicular recording media

In order to understand the formation of nano-size magnetic domains in Co/sub 76/Cr/sub 24/ thin films for ultra-high density perpendicular magnetic recording, film thickness and sputtering gas pressures were investigated using a facing target sputtering (FTS) apparatus. Investigations of these films...

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Bibliographic Details
Published in:IEEE transactions on magnetics 1998-07, Vol.34 (4), p.1642-1644
Main Authors: Kadokura, S., Naoe, M., Nakagawa, S., Maeda, Y.
Format: Article
Language:English
Subjects:
Coercive force
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Crystallization
Exact sciences and technology
Lattices
Magnetic films
Magnetic properties and materials
Magnetic recording materials
Paramagnetic materials
Perpendicular magnetic recording
Physics
Plasma temperature
Polyimides
Sputtering
Studies of specific magnetic materials
Substrates
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Summary:In order to understand the formation of nano-size magnetic domains in Co/sub 76/Cr/sub 24/ thin films for ultra-high density perpendicular magnetic recording, film thickness and sputtering gas pressures were investigated using a facing target sputtering (FTS) apparatus. Investigations of these films showed thy were composed of highly oriented hcp crystallites with lower Cr content (C/sub Cr/) of isolated ferromagnetic areas uniformly distributed in the higher C/sub Cr/ host paramagnetic matrix. The diameter of the lower C/sub Cr/ areas in these films was between 3-5 nm. The perpendicular coercivity in the surface region was greater than 2400 Oe. Consequently, this film is considered to be a good candidate for perpendicular magnetic recording densities approaching 1000 Kfci (10 Gb/in/sup 2/).
ISSN:0018-9464
1941-0069
DOI:10.1109/20.706642