Electrical Contact Resistance of Multi-Contact Connector in Semi-Retractable Current Lead

Heat leakage through current leads is the dominant contributor to cryogenic heat load for various high field magnets. The semi-retractable current lead is a good option because the conductive heat leak can be eliminated after the magnet is charged. It is composed of a normal metal element and an HTS...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.1050-1053
Main Authors: Choi, Yeon Suk, Kim, Dong Lak, Kim, Myung Su
Format: Article
Language:English
Subjects:
Applied sciences
Capacitors. Resistors. Filters
Connectors
Contacts
Current lead
electrical contact resistance
Electrical engineering. Electrical power engineering
Electromagnets
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Interfaces
Lead
Resistance
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
superconducting magnet
Superconducting magnets
Temperature
Temperature measurement
Various equipment and components
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Heat leakage through current leads is the dominant contributor to cryogenic heat load for various high field magnets. The semi-retractable current lead is a good option because the conductive heat leak can be eliminated after the magnet is charged. It is composed of a normal metal element and an HTS element. The normal metal element is disengaged from the HTS element through the multi-contact connector without disturbance to the insulating vacuum space and without requiring complete removal of the normal metal element. In this paper, the electrical contact resistance of multi-contact connector is measured to confirm the feasibility of our application. The effects of current level, operating temperature and size on the electrical contact resistance in a lockable set are also discussed.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2010.2103353