Electron Backscatter Diffraction Analysis on Nb3Sn and Nb3Al Multifilaments

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Bibliographic Details
Main Authors: TAKEUCHI, T, TSUCHIYA, K, SAEDA, M, BANNO, N, KIKUCHI, A, IIJIMA, Y
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electrical engineering. Electrical power engineering
Electromagnets
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Various equipment and components
Online Access:Get full text
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ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2010.2083625