Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2011-08, Vol.44 (31)
Main Authors: ABEDRABBO, S, LAHLOUH, B, FIORY, A. T
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physical properties of thin films, nonelectronic
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thermal stability
thermal effects
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Summary:
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/44/31/315401