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Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films
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Published in: | Journal of physics. D, Applied physics Applied physics, 2011-08, Vol.44 (31) |
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Language: | English |
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container_issue | 31 |
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container_title | Journal of physics. D, Applied physics |
container_volume | 44 |
creator | ABEDRABBO, S LAHLOUH, B FIORY, A. T |
description | |
doi_str_mv | 10.1088/0022-3727/44/31/315401 |
format | article |
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language | eng |
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source | Institute of Physics |
subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Liquid phase epitaxy deposition from liquid phases (melts, solutions, and surface layers on liquids) Materials science Methods of deposition of films and coatings film growth and epitaxy Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thermal stability thermal effects |
title | Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films |
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