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container_issue 31
container_start_page
container_title Journal of physics. D, Applied physics
container_volume 44
creator ABEDRABBO, S
LAHLOUH, B
FIORY, A. T
description
doi_str_mv 10.1088/0022-3727/44/31/315401
format article
fullrecord <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_24419503</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>24419503</sourcerecordid><originalsourceid>FETCH-LOGICAL-p185t-fcc3da4b5c2ff65fcc7e7776bafbef8755d18fb29bfb2351b0632b120b0cf24c3</originalsourceid><addsrcrecordid>eNo9j81KAzEUhYMoOFZfQbJxOU7-M12WUn-g0I2uS5JJ2kgmMyQzQne-hC_okxhRhMs9nHMPH1wAbjG6x6htG4QIqakksmGsobgMZwifgQpTgWvBBD0H1X_pElzl_IYQ4qLFFdCrqMJp8kYFmKe5O8HBweloU18CFaNVwccD1Pao3v0wp5-zTdrPPbS9z9kPEfoIN4nsaJ2H8PXxebAF5UNBQudDn6_BhVMh25s_XYDXh83L-qne7h6f16ttPeKWT7UzhnaKaW6Ic4IXK62UUmjltHWt5LzDrdNkqcuiHGskKNGYII2MI8zQBbj75Y4ql3dcUtH4vB-T71U67QljeMkRpd9ilFuw</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films</title><source>Institute of Physics</source><creator>ABEDRABBO, S ; LAHLOUH, B ; FIORY, A. T</creator><creatorcontrib>ABEDRABBO, S ; LAHLOUH, B ; FIORY, A. T</creatorcontrib><identifier>ISSN: 0022-3727</identifier><identifier>EISSN: 1361-6463</identifier><identifier>DOI: 10.1088/0022-3727/44/31/315401</identifier><identifier>CODEN: JPAPBE</identifier><language>eng</language><publisher>Bristol: Institute of Physics</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids) ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of specific thin films ; Physical properties of thin films, nonelectronic ; Physics ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thermal stability; thermal effects</subject><ispartof>Journal of physics. D, Applied physics, 2011-08, Vol.44 (31)</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=24419503$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ABEDRABBO, S</creatorcontrib><creatorcontrib>LAHLOUH, B</creatorcontrib><creatorcontrib>FIORY, A. T</creatorcontrib><title>Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films</title><title>Journal of physics. D, Applied physics</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of specific thin films</subject><subject>Physical properties of thin films, nonelectronic</subject><subject>Physics</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thermal stability; thermal effects</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNo9j81KAzEUhYMoOFZfQbJxOU7-M12WUn-g0I2uS5JJ2kgmMyQzQne-hC_okxhRhMs9nHMPH1wAbjG6x6htG4QIqakksmGsobgMZwifgQpTgWvBBD0H1X_pElzl_IYQ4qLFFdCrqMJp8kYFmKe5O8HBweloU18CFaNVwccD1Pao3v0wp5-zTdrPPbS9z9kPEfoIN4nsaJ2H8PXxebAF5UNBQudDn6_BhVMh25s_XYDXh83L-qne7h6f16ttPeKWT7UzhnaKaW6Ic4IXK62UUmjltHWt5LzDrdNkqcuiHGskKNGYII2MI8zQBbj75Y4ql3dcUtH4vB-T71U67QljeMkRpd9ilFuw</recordid><startdate>20110810</startdate><enddate>20110810</enddate><creator>ABEDRABBO, S</creator><creator>LAHLOUH, B</creator><creator>FIORY, A. T</creator><general>Institute of Physics</general><scope>IQODW</scope></search><sort><creationdate>20110810</creationdate><title>Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films</title><author>ABEDRABBO, S ; LAHLOUH, B ; FIORY, A. T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p185t-fcc3da4b5c2ff65fcc7e7776bafbef8755d18fb29bfb2351b0632b120b0cf24c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of specific thin films</topic><topic>Physical properties of thin films, nonelectronic</topic><topic>Physics</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thermal stability; thermal effects</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ABEDRABBO, S</creatorcontrib><creatorcontrib>LAHLOUH, B</creatorcontrib><creatorcontrib>FIORY, A. T</creatorcontrib><collection>Pascal-Francis</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ABEDRABBO, S</au><au>LAHLOUH, B</au><au>FIORY, A. T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><date>2011-08-10</date><risdate>2011</risdate><volume>44</volume><issue>31</issue><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><cop>Bristol</cop><pub>Institute of Physics</pub><doi>10.1088/0022-3727/44/31/315401</doi></addata></record>
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ispartof Journal of physics. D, Applied physics, 2011-08, Vol.44 (31)
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1361-6463
language eng
recordid cdi_pascalfrancis_primary_24419503
source Institute of Physics
subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physical properties of thin films, nonelectronic
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thermal stability
thermal effects
title Analytical study of thermal annealing behaviour of erbium emission in Er2O3-sol―gel silica films
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T20%3A39%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analytical%20study%20of%20thermal%20annealing%20behaviour%20of%20erbium%20emission%20in%20Er2O3-sol%E2%80%95gel%20silica%20films&rft.jtitle=Journal%20of%20physics.%20D,%20Applied%20physics&rft.au=ABEDRABBO,%20S&rft.date=2011-08-10&rft.volume=44&rft.issue=31&rft.issn=0022-3727&rft.eissn=1361-6463&rft.coden=JPAPBE&rft_id=info:doi/10.1088/0022-3727/44/31/315401&rft_dat=%3Cpascalfrancis%3E24419503%3C/pascalfrancis%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p185t-fcc3da4b5c2ff65fcc7e7776bafbef8755d18fb29bfb2351b0632b120b0cf24c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true