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Solution-Processed Memristive Junctions Used in a Threshold Indicator
Inkjet-patterned memristive metal/oxide/metal structures were characterized to infer ionic and electronic transport parameters such as mobility and ion distribution. The conductance change with respect to voltage and time was measured for an individual crossbar junction and for junctions that are co...
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Published in: | IEEE transactions on electron devices 2011-10, Vol.58 (10), p.3435-3443 |
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creator | Tse Nga Ng Russo, B. Arias, A. C. |
description | Inkjet-patterned memristive metal/oxide/metal structures were characterized to infer ionic and electronic transport parameters such as mobility and ion distribution. The conductance change with respect to voltage and time was measured for an individual crossbar junction and for junctions that are connected in series. It was found that continuous dopant redistribution during voltage scans led to a peak in conductance. The mutable conductance of memristive devices was utilized to demonstrate a threshold indicator, in which the crossbar junctions were connected with a piezo sensor input and an electrophoretic display output. The memristive circuit would switch the color of display pixels, depending on the number of input pulses sensed by the piezo. The threshold indicator demonstrates that memristive junctions can be used as integral control switches. It is composed of passive circuit components and does not require an external battery. |
doi_str_mv | 10.1109/TED.2011.2162334 |
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fullrecord | <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_pascalfrancis_primary_24707965</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5991940</ieee_id><sourcerecordid>926320225</sourcerecordid><originalsourceid>FETCH-LOGICAL-c352t-730ada9f40f37936f2fcca85807411e89f6c046eaafc1e2a609025fb1aea4cd23</originalsourceid><addsrcrecordid>eNpdkM1LAzEQxYMoWKt3wcsiiKet-d7NUbRqpaJgew4xO6Ep201NdgX_e3dp6cHTMLzfm3k8hC4JnhCC1d1i-jihmJAJJZIyxo_QiAhR5EpyeYxGGJMyV6xkp-gspXW_Ss7pCE0_Q921PjT5RwwWUoIqe4NN9Kn1P5C9do0d1JQtB8U3mckWqwhpFeoqmzWVt6YN8RydOFMnuNjPMVo-TRcPL_n8_Xn2cD_PLRO0zQuGTWWU49ixQjHpqLPWlKLEBScESuWkxVyCMc4SoEZihalwX8SA4baibIxud3e3MXx3kFq98clCXZsGQpe0opJRTKnoyet_5Dp0senD6VKxPo0QpIfwDrIxpBTB6W30GxN_NcF6aFX3reqhVb1vtbfc7O-aZE3tommsTwcf5QUulBz-X-04DwAHWShFFMfsD1PEf2E</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>893352551</pqid></control><display><type>article</type><title>Solution-Processed Memristive Junctions Used in a Threshold Indicator</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Tse Nga Ng ; Russo, B. ; Arias, A. C.</creator><creatorcontrib>Tse Nga Ng ; Russo, B. ; Arias, A. C.</creatorcontrib><description>Inkjet-patterned memristive metal/oxide/metal structures were characterized to infer ionic and electronic transport parameters such as mobility and ion distribution. The conductance change with respect to voltage and time was measured for an individual crossbar junction and for junctions that are connected in series. It was found that continuous dopant redistribution during voltage scans led to a peak in conductance. The mutable conductance of memristive devices was utilized to demonstrate a threshold indicator, in which the crossbar junctions were connected with a piezo sensor input and an electrophoretic display output. The memristive circuit would switch the color of display pixels, depending on the number of input pulses sensed by the piezo. The threshold indicator demonstrates that memristive junctions can be used as integral control switches. It is composed of passive circuit components and does not require an external battery.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2011.2162334</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuits ; Compound structure devices ; Conductance ; Current measurement ; Design. Technologies. Operation analysis. Testing ; Devices ; Display ; Electric potential ; Electrodes ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Indicators ; Integrated circuits ; Junctions ; Memristive device ; printed electronics ; resistive switch ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; solgel titanium dioxide ; Switches ; Thresholds ; Time measurement ; Titanium ; Voltage ; Voltage measurement</subject><ispartof>IEEE transactions on electron devices, 2011-10, Vol.58 (10), p.3435-3443</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-730ada9f40f37936f2fcca85807411e89f6c046eaafc1e2a609025fb1aea4cd23</citedby><cites>FETCH-LOGICAL-c352t-730ada9f40f37936f2fcca85807411e89f6c046eaafc1e2a609025fb1aea4cd23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5991940$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24707965$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Tse Nga Ng</creatorcontrib><creatorcontrib>Russo, B.</creatorcontrib><creatorcontrib>Arias, A. C.</creatorcontrib><title>Solution-Processed Memristive Junctions Used in a Threshold Indicator</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>Inkjet-patterned memristive metal/oxide/metal structures were characterized to infer ionic and electronic transport parameters such as mobility and ion distribution. The conductance change with respect to voltage and time was measured for an individual crossbar junction and for junctions that are connected in series. It was found that continuous dopant redistribution during voltage scans led to a peak in conductance. The mutable conductance of memristive devices was utilized to demonstrate a threshold indicator, in which the crossbar junctions were connected with a piezo sensor input and an electrophoretic display output. The memristive circuit would switch the color of display pixels, depending on the number of input pulses sensed by the piezo. The threshold indicator demonstrates that memristive junctions can be used as integral control switches. It is composed of passive circuit components and does not require an external battery.</description><subject>Applied sciences</subject><subject>Circuits</subject><subject>Compound structure devices</subject><subject>Conductance</subject><subject>Current measurement</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Devices</subject><subject>Display</subject><subject>Electric potential</subject><subject>Electrodes</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Indicators</subject><subject>Integrated circuits</subject><subject>Junctions</subject><subject>Memristive device</subject><subject>printed electronics</subject><subject>resistive switch</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>solgel titanium dioxide</subject><subject>Switches</subject><subject>Thresholds</subject><subject>Time measurement</subject><subject>Titanium</subject><subject>Voltage</subject><subject>Voltage measurement</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNpdkM1LAzEQxYMoWKt3wcsiiKet-d7NUbRqpaJgew4xO6Ep201NdgX_e3dp6cHTMLzfm3k8hC4JnhCC1d1i-jihmJAJJZIyxo_QiAhR5EpyeYxGGJMyV6xkp-gspXW_Ss7pCE0_Q921PjT5RwwWUoIqe4NN9Kn1P5C9do0d1JQtB8U3mckWqwhpFeoqmzWVt6YN8RydOFMnuNjPMVo-TRcPL_n8_Xn2cD_PLRO0zQuGTWWU49ixQjHpqLPWlKLEBScESuWkxVyCMc4SoEZihalwX8SA4baibIxud3e3MXx3kFq98clCXZsGQpe0opJRTKnoyet_5Dp0senD6VKxPo0QpIfwDrIxpBTB6W30GxN_NcF6aFX3reqhVb1vtbfc7O-aZE3tommsTwcf5QUulBz-X-04DwAHWShFFMfsD1PEf2E</recordid><startdate>20111001</startdate><enddate>20111001</enddate><creator>Tse Nga Ng</creator><creator>Russo, B.</creator><creator>Arias, A. C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20111001</creationdate><title>Solution-Processed Memristive Junctions Used in a Threshold Indicator</title><author>Tse Nga Ng ; Russo, B. ; Arias, A. C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-730ada9f40f37936f2fcca85807411e89f6c046eaafc1e2a609025fb1aea4cd23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Applied sciences</topic><topic>Circuits</topic><topic>Compound structure devices</topic><topic>Conductance</topic><topic>Current measurement</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Devices</topic><topic>Display</topic><topic>Electric potential</topic><topic>Electrodes</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Indicators</topic><topic>Integrated circuits</topic><topic>Junctions</topic><topic>Memristive device</topic><topic>printed electronics</topic><topic>resistive switch</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>solgel titanium dioxide</topic><topic>Switches</topic><topic>Thresholds</topic><topic>Time measurement</topic><topic>Titanium</topic><topic>Voltage</topic><topic>Voltage measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tse Nga Ng</creatorcontrib><creatorcontrib>Russo, B.</creatorcontrib><creatorcontrib>Arias, A. C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tse Nga Ng</au><au>Russo, B.</au><au>Arias, A. C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Solution-Processed Memristive Junctions Used in a Threshold Indicator</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2011-10-01</date><risdate>2011</risdate><volume>58</volume><issue>10</issue><spage>3435</spage><epage>3443</epage><pages>3435-3443</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Inkjet-patterned memristive metal/oxide/metal structures were characterized to infer ionic and electronic transport parameters such as mobility and ion distribution. The conductance change with respect to voltage and time was measured for an individual crossbar junction and for junctions that are connected in series. It was found that continuous dopant redistribution during voltage scans led to a peak in conductance. The mutable conductance of memristive devices was utilized to demonstrate a threshold indicator, in which the crossbar junctions were connected with a piezo sensor input and an electrophoretic display output. The memristive circuit would switch the color of display pixels, depending on the number of input pulses sensed by the piezo. The threshold indicator demonstrates that memristive junctions can be used as integral control switches. It is composed of passive circuit components and does not require an external battery.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TED.2011.2162334</doi><tpages>9</tpages></addata></record> |
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subjects | Applied sciences Circuits Compound structure devices Conductance Current measurement Design. Technologies. Operation analysis. Testing Devices Display Electric potential Electrodes Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Indicators Integrated circuits Junctions Memristive device printed electronics resistive switch Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices solgel titanium dioxide Switches Thresholds Time measurement Titanium Voltage Voltage measurement |
title | Solution-Processed Memristive Junctions Used in a Threshold Indicator |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T00%3A09%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Solution-Processed%20Memristive%20Junctions%20Used%20in%20a%20Threshold%20Indicator&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Tse%20Nga%20Ng&rft.date=2011-10-01&rft.volume=58&rft.issue=10&rft.spage=3435&rft.epage=3443&rft.pages=3435-3443&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/TED.2011.2162334&rft_dat=%3Cproquest_pasca%3E926320225%3C/proquest_pasca%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c352t-730ada9f40f37936f2fcca85807411e89f6c046eaafc1e2a609025fb1aea4cd23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=893352551&rft_id=info:pmid/&rft_ieee_id=5991940&rfr_iscdi=true |