X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging

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Bibliographic Details
Published in:Physica status solidi. A, Applications and materials science Applications and materials science, 2011, Vol.208 (11), p.2552-2557
Main Authors: MOLODKIN, V. B, OLIKHOVSKII, S. I, FODCHUK, I. M, LYTVYNCHUK, T. V, KLAD'KO, V. P, SWIATEK, Z, LEN, E. G, SHELUDCHENKO, B. V, LIZUNOVA, S. V, KYSLOVS'KYY, Ye. M, VLADIMIROVA, T. P, KOCHELAB, E. V, RESHETNYK, O. V, DOVGANYUK, V. V
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Experimental determination of defects by diffraction and scattering
Physics
Structure of solids and liquids
crystallography
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ISSN:1862-6300
1862-6319