X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging

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Published in:Physica status solidi. A, Applications and materials science Applications and materials science, 2011, Vol.208 (11), p.2552-2557
Main Authors: MOLODKIN, V. B, OLIKHOVSKII, S. I, FODCHUK, I. M, LYTVYNCHUK, T. V, KLAD'KO, V. P, SWIATEK, Z, LEN, E. G, SHELUDCHENKO, B. V, LIZUNOVA, S. V, KYSLOVS'KYY, Ye. M, VLADIMIROVA, T. P, KOCHELAB, E. V, RESHETNYK, O. V, DOVGANYUK, V. V
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Experimental determination of defects by diffraction and scattering
Physics
Structure of solids and liquids
crystallography
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container_end_page 2557
container_issue 11
container_start_page 2552
container_title Physica status solidi. A, Applications and materials science
container_volume 208
creator MOLODKIN, V. B
OLIKHOVSKII, S. I
FODCHUK, I. M
LYTVYNCHUK, T. V
KLAD'KO, V. P
SWIATEK, Z
LEN, E. G
SHELUDCHENKO, B. V
LIZUNOVA, S. V
KYSLOVS'KYY, Ye. M
VLADIMIROVA, T. P
KOCHELAB, E. V
RESHETNYK, O. V
DOVGANYUK, V. V
description
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source Wiley-Blackwell Read & Publish Collection
subjects Condensed matter: structure, mechanical and thermal properties
Defects and impurities in crystals
microstructure
Exact sciences and technology
Experimental determination of defects by diffraction and scattering
Physics
Structure of solids and liquids
crystallography
title X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation : High-resolution X-ray Diffraction and Imaging
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