Carrier transport mechanism in La-incorporated high-κ dielectric/metal gate stack MOSFETs

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Bibliographic Details
Main Authors: KWON, Hyuk-Min, CHOI, Won-Ho, HAN, In-Shik, NA, Min-Ki, PARK, Sang-Uk, BOK, Jung-Deuk, KANG, Chang-Yong, LEE, Byoung-Hun, JAMMY, Raj, LEE, Hi-Deok
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronics
Exact sciences and technology
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Surface double layers, schottky barriers, and work functions
Transistors
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ISSN:0167-9317
1873-5568