Loading…

Electronic Speckle Pattern Interferometry applied to the study and conservation of paintings: Speckle and speckle shearing interferometry. I

Saved in:
Bibliographic Details
Published in:Optics and lasers in engineering 1997, Vol.26 (2-3), p.221-233
Main Authors: LUCIA, A. C, ZANETTA, P. M, FACCHINI, M
Format: Article
Language:English
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0143-8166
1873-0302