Imaging and manipulation of the Si100 surface by small-amplitude NC-AFM at zero and very low applied bias : Non-contact AFM

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2012, Vol.24 (8)
Main Authors: SWEETMAN, A, DANZA, R, GANGOPADHYAY, S, MORIARTY, P
Format: Article
Language:English
Subjects:
Composition
defects and impurities
Condensed matter: structure, mechanical and thermal properties
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Physics
Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
Solid surfaces and solid-solid interfaces
Structure of solids and liquids
crystallography
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Online Access:Get full text
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ISSN:0953-8984
1361-648X