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A Capacitance Type Chemical Sensor Based on AlPO4-5 Molecular Sieves
Thin films of AlPO4-5 molecular sieves have been employed as the dielectric phase in a capacitance type chemical sensor. AlPO4-5 was deposited onto titanium nitride (bottom electrode) coated silicon wafers by laser ablation. A subsequent hydrothermal treatment of the ablated AlPO4-5 films was found...
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Published in: | Chemistry of materials 1997-01, Vol.9 (1), p.380-386 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | Thin films of AlPO4-5 molecular sieves have been employed as the dielectric phase in a capacitance type chemical sensor. AlPO4-5 was deposited onto titanium nitride (bottom electrode) coated silicon wafers by laser ablation. A subsequent hydrothermal treatment of the ablated AlPO4-5 films was found to enhance the crystallinity. The capacitance sensor configuration was completed by the deposition of Pd/Au pads (upper electrode) through a mask. AlPO4-5 based sensors exhibited significant changes in capacitance upon exposure to small molecules such as CO2, CO, N2, and H2O. |
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ISSN: | 0897-4756 1520-5002 |
DOI: | 10.1021/cm960041n |