Loading…

Characterization of Differential Transmission Lines for Integrated Millimeter-Wave Applications

This letter focuses on the characterization of differential transmission lines (T-lines) typically used in millimeter-wave integrated circuits. Common- and differential-mode propagation constants were calculated and validated in two experimental steps. A four-port scattering parameter (S-parameter)...

Full description

Saved in:
Bibliographic Details
Published in:IEEE microwave and wireless components letters 2012-04, Vol.22 (4), p.188-190
Main Authors: Hamidipour, A., Jahn, M., Jaeger, H., Stelzer, A.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This letter focuses on the characterization of differential transmission lines (T-lines) typically used in millimeter-wave integrated circuits. Common- and differential-mode propagation constants were calculated and validated in two experimental steps. A four-port scattering parameter (S-parameter) measurement followed by a multi-line calibration was performed. In addition, several two-port S-parameter measurements were conducted using a set of three marchand baluns. Comparison of the values extracted from simulations and two experiments shows very good agreement over a broad frequency range from 65 to 170 GHz.
ISSN:1531-1309
2771-957X
1558-1764
2771-9588
DOI:10.1109/LMWC.2012.2188022