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Characterization of Differential Transmission Lines for Integrated Millimeter-Wave Applications
This letter focuses on the characterization of differential transmission lines (T-lines) typically used in millimeter-wave integrated circuits. Common- and differential-mode propagation constants were calculated and validated in two experimental steps. A four-port scattering parameter (S-parameter)...
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Published in: | IEEE microwave and wireless components letters 2012-04, Vol.22 (4), p.188-190 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | This letter focuses on the characterization of differential transmission lines (T-lines) typically used in millimeter-wave integrated circuits. Common- and differential-mode propagation constants were calculated and validated in two experimental steps. A four-port scattering parameter (S-parameter) measurement followed by a multi-line calibration was performed. In addition, several two-port S-parameter measurements were conducted using a set of three marchand baluns. Comparison of the values extracted from simulations and two experiments shows very good agreement over a broad frequency range from 65 to 170 GHz. |
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ISSN: | 1531-1309 2771-957X 1558-1764 2771-9588 |
DOI: | 10.1109/LMWC.2012.2188022 |