Ultrafast voltage-contrast scanning probe microscopy : Ordered molecular and nanoscale electronics

Saved in:
Bibliographic Details
Published in:Nanotechnology 1996, Vol.7 (4), p.385-389
Main Authors: HO, F, HOU, A. S, NECHAY, B. A, BLOOM, D. M
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components and techniques
Scanning tunneling microscopes
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0957-4484
1361-6528