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Single Die Multiple 600 V Power Diodes With Deep Trench Terminations and Isolation
This paper presents a new concept for low cost and high reliability monolithic integration of vertical power devices. The concept relies on the creation of deep trench terminations on the edge of the device, thus allowing to avoid 3 D peak surface electric field levels whereas complete insulation of...
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Published in: | IEEE transactions on power electronics 2011-11, Vol.26 (11), p.3423-3429 |
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container_title | IEEE transactions on power electronics |
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creator | Vladimirova, K. Crebier, J.-C Avenas, Y. Schaeffer, C. |
description | This paper presents a new concept for low cost and high reliability monolithic integration of vertical power devices. The concept relies on the creation of deep trench terminations on the edge of the device, thus allowing to avoid 3 D peak surface electric field levels whereas complete insulation of the integrated power devices sharing the same backside contact electrode is guaranteed. Simulation results show that the stress of the electric field can be further reduced by introducing an angle on the trench termination walls. Power diodes in the range of 600 V with 87° wall angles of the 100-μm deep trench terminations are fabricated to demonstrate the feasibility and the effectiveness of the concept. The multidiode devices were experimentally tested under static and dynamic practical conditions. The fabricated prototypes fulfilled the initial design electrical specifications considering the breakdown voltage rating and demonstrated an excellent functional behavior. The implementation of the multidiode device into an interleaved converter is presented in this paper. |
doi_str_mv | 10.1109/TPEL.2011.2145390 |
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The concept relies on the creation of deep trench terminations on the edge of the device, thus allowing to avoid 3 D peak surface electric field levels whereas complete insulation of the integrated power devices sharing the same backside contact electrode is guaranteed. Simulation results show that the stress of the electric field can be further reduced by introducing an angle on the trench termination walls. Power diodes in the range of 600 V with 87° wall angles of the 100-μm deep trench terminations are fabricated to demonstrate the feasibility and the effectiveness of the concept. The multidiode devices were experimentally tested under static and dynamic practical conditions. The fabricated prototypes fulfilled the initial design electrical specifications considering the breakdown voltage rating and demonstrated an excellent functional behavior. The implementation of the multidiode device into an interleaved converter is presented in this paper.</description><identifier>ISSN: 0885-8993</identifier><identifier>EISSN: 1941-0107</identifier><identifier>DOI: 10.1109/TPEL.2011.2145390</identifier><identifier>CODEN: ITPEE8</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Dielectric materials ; Diodes ; Electric fields ; Electric power ; Electrical engineering. Electrical power engineering ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Engineering Sciences ; Exact sciences and technology ; Insulation ; Integrated circuits ; Junctions ; Metals ; Monolithic integrated circuits ; Other multijunction devices. Power transistors. Thyristors ; Power electronics, power supplies ; power semiconductor diodes ; Prototypes ; Semiconductor diodes ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Silicon ; Simulation ; Substrates ; switching converters ; wafer scale integration</subject><ispartof>IEEE transactions on power electronics, 2011-11, Vol.26 (11), p.3423-3429</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2011</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c356t-8cae912ad9f57837003e3aa799a74b783032415fc1f4622c3defa8c3a66bd8ba3</citedby><cites>FETCH-LOGICAL-c356t-8cae912ad9f57837003e3aa799a74b783032415fc1f4622c3defa8c3a66bd8ba3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5753945$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,776,780,881,27901,27902,54771</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26015541$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-00709834$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Vladimirova, K.</creatorcontrib><creatorcontrib>Crebier, J.-C</creatorcontrib><creatorcontrib>Avenas, Y.</creatorcontrib><creatorcontrib>Schaeffer, C.</creatorcontrib><title>Single Die Multiple 600 V Power Diodes With Deep Trench Terminations and Isolation</title><title>IEEE transactions on power electronics</title><addtitle>TPEL</addtitle><description>This paper presents a new concept for low cost and high reliability monolithic integration of vertical power devices. The concept relies on the creation of deep trench terminations on the edge of the device, thus allowing to avoid 3 D peak surface electric field levels whereas complete insulation of the integrated power devices sharing the same backside contact electrode is guaranteed. Simulation results show that the stress of the electric field can be further reduced by introducing an angle on the trench termination walls. Power diodes in the range of 600 V with 87° wall angles of the 100-μm deep trench terminations are fabricated to demonstrate the feasibility and the effectiveness of the concept. The multidiode devices were experimentally tested under static and dynamic practical conditions. The fabricated prototypes fulfilled the initial design electrical specifications considering the breakdown voltage rating and demonstrated an excellent functional behavior. The implementation of the multidiode device into an interleaved converter is presented in this paper.</description><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Dielectric materials</subject><subject>Diodes</subject><subject>Electric fields</subject><subject>Electric power</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Engineering Sciences</subject><subject>Exact sciences and technology</subject><subject>Insulation</subject><subject>Integrated circuits</subject><subject>Junctions</subject><subject>Metals</subject><subject>Monolithic integrated circuits</subject><subject>Other multijunction devices. Power transistors. Thyristors</subject><subject>Power electronics, power supplies</subject><subject>power semiconductor diodes</subject><subject>Prototypes</subject><subject>Semiconductor diodes</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silicon</subject><subject>Simulation</subject><subject>Substrates</subject><subject>switching converters</subject><subject>wafer scale integration</subject><issn>0885-8993</issn><issn>1941-0107</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNo9kMFu2zAMhoWiA5p2e4ChF6FADzs4Iy3Lto5F260FMqzYsu0oMDLdqHDtVHJW9O0nL0FOBMmPH4hfiI8Ic0Qwn5cPt4t5DojzHAutDByJGZoCM0CojsUM6lpntTHqRJzG-ASQKMCZ-PHT948dyxvP8tu2G_0mNSWA_C0fhlcOaTE0HOUfP67lDfNGLgP3bi2XHJ59T6Mf-iipb-R9HLr_7XvxrqUu8od9PRO_vtwur--yxfev99dXi8wpXY5Z7YgN5tSYVle1qgAUK6LKGKqKVZqAygvUrcO2KPPcqYZbqp2islw19YrUmfi0866ps5vgnym82YG8vbta2GkGUIGpVfEXE3uxYzdheNlyHO3TsA19es8aKKHKQRcJwh3kwhBj4PZgRbBTynZK2U4p233K6eZyL6boqGsD9c7Hw2FeAmpdTA-c7zjPzIe1rpIkif4B3iWCvQ</recordid><startdate>20111101</startdate><enddate>20111101</enddate><creator>Vladimirova, K.</creator><creator>Crebier, J.-C</creator><creator>Avenas, Y.</creator><creator>Schaeffer, C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>1XC</scope></search><sort><creationdate>20111101</creationdate><title>Single Die Multiple 600 V Power Diodes With Deep Trench Terminations and Isolation</title><author>Vladimirova, K. ; Crebier, J.-C ; Avenas, Y. ; Schaeffer, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c356t-8cae912ad9f57837003e3aa799a74b783032415fc1f4622c3defa8c3a66bd8ba3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Dielectric materials</topic><topic>Diodes</topic><topic>Electric fields</topic><topic>Electric power</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Engineering Sciences</topic><topic>Exact sciences and technology</topic><topic>Insulation</topic><topic>Integrated circuits</topic><topic>Junctions</topic><topic>Metals</topic><topic>Monolithic integrated circuits</topic><topic>Other multijunction devices. Power transistors. Thyristors</topic><topic>Power electronics, power supplies</topic><topic>power semiconductor diodes</topic><topic>Prototypes</topic><topic>Semiconductor diodes</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silicon</topic><topic>Simulation</topic><topic>Substrates</topic><topic>switching converters</topic><topic>wafer scale integration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vladimirova, K.</creatorcontrib><creatorcontrib>Crebier, J.-C</creatorcontrib><creatorcontrib>Avenas, Y.</creatorcontrib><creatorcontrib>Schaeffer, C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library Online</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>IEEE transactions on power electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vladimirova, K.</au><au>Crebier, J.-C</au><au>Avenas, Y.</au><au>Schaeffer, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Single Die Multiple 600 V Power Diodes With Deep Trench Terminations and Isolation</atitle><jtitle>IEEE transactions on power electronics</jtitle><stitle>TPEL</stitle><date>2011-11-01</date><risdate>2011</risdate><volume>26</volume><issue>11</issue><spage>3423</spage><epage>3429</epage><pages>3423-3429</pages><issn>0885-8993</issn><eissn>1941-0107</eissn><coden>ITPEE8</coden><abstract>This paper presents a new concept for low cost and high reliability monolithic integration of vertical power devices. The concept relies on the creation of deep trench terminations on the edge of the device, thus allowing to avoid 3 D peak surface electric field levels whereas complete insulation of the integrated power devices sharing the same backside contact electrode is guaranteed. Simulation results show that the stress of the electric field can be further reduced by introducing an angle on the trench termination walls. Power diodes in the range of 600 V with 87° wall angles of the 100-μm deep trench terminations are fabricated to demonstrate the feasibility and the effectiveness of the concept. The multidiode devices were experimentally tested under static and dynamic practical conditions. The fabricated prototypes fulfilled the initial design electrical specifications considering the breakdown voltage rating and demonstrated an excellent functional behavior. The implementation of the multidiode device into an interleaved converter is presented in this paper.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TPEL.2011.2145390</doi><tpages>7</tpages></addata></record> |
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subjects | Applied sciences Design. Technologies. Operation analysis. Testing Dielectric materials Diodes Electric fields Electric power Electrical engineering. Electrical power engineering Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Engineering Sciences Exact sciences and technology Insulation Integrated circuits Junctions Metals Monolithic integrated circuits Other multijunction devices. Power transistors. Thyristors Power electronics, power supplies power semiconductor diodes Prototypes Semiconductor diodes Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon Simulation Substrates switching converters wafer scale integration |
title | Single Die Multiple 600 V Power Diodes With Deep Trench Terminations and Isolation |
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