Turn-Off Time as an Early Indicator of Insulated Gate Bipolar Transistor Latch-up : ROBUST OPERATION OF ELECTRICAL DRIVES

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Bibliographic Details
Published in:IEEE transactions on power electronics 2012, Vol.27 (1-2), p.479-489
Main Authors: BROWN, Douglas W, ABBAS, Manzar, GINART, Antonio, ALI, Irfan N, KALGREN, Patrick W, VACHTSEVANOS, George J
Format: Article
Language:English
Subjects:
Applied sciences
Electrical engineering. Electrical power engineering
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Other multijunction devices. Power transistors. Thyristors
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Testing. Reliability. Quality control
Online Access:Get full text
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ISSN:0885-8993
1941-0107