Loading…

The interface roughness exponent in GexSi1-x/Si superlattices

Saved in:

Bibliographic Details
Published in:	Journal of physics. Condensed matter 1997-04, Vol.9 (14), p.2891-2902
Main Authors:	CUI, S. F, LUO, G. M, LI, M, MAI, Z. H, CUI, Q, ZHOU, J. M, JIANG, X. M, ZHANG, W. L
Format:	Article
Language:	English
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Elemental semiconductors and insulators Exact sciences and technology Interface structure and roughness Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!