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The interface roughness exponent in GexSi1-x/Si superlattices
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| Published in: | Journal of physics. Condensed matter 1997-04, Vol.9 (14), p.2891-2902 |
|---|---|
| Main Authors: | , , , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Online Access: | Get full text |
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| container_end_page | 2902 |
| container_issue | 14 |
| container_start_page | 2891 |
| container_title | Journal of physics. Condensed matter |
| container_volume | 9 |
| creator | CUI, S. F LUO, G. M LI, M MAI, Z. H CUI, Q ZHOU, J. M JIANG, X. M ZHANG, W. L |
| description | |
| doi_str_mv | 10.1088/0953-8984/9/14/005 |
| format | article |
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L</creatorcontrib><title>The interface roughness exponent in GexSi1-x/Si superlattices</title><title>Journal of physics. Condensed matter</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Elemental semiconductors and insulators</subject><subject>Exact sciences and technology</subject><subject>Interface structure and roughness</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of specific thin films</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0953-8984</issn><issn>1361-648X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9jsFKAzEURYMoOFZ_wNUs3MZ5b5KJLwsXUrQKBRet4K6kkxcbqdMhmcL49w4owoW7OJfDFeIa4RaBqALbKEmWdGUr1BVAcyIKVAal0fR-Kor_wbm4yPkTADQpXYj79Y7L2A2cgmu5TIfjx67jnEse-0PH3TDBcsHjKqIcq1Us87HntHfDEFvOl-IsuH3mq7-eibenx_X8WS5fFy_zh6XskepBNhopKEVb51jfeT_dICTtt17bQAGM9QAWvEdCTY6VAW2AQdVT2rpWM3Hz6-1dbt0-JNe1MW_6FL9c-t7UBg2qRv0Ad-BKWg</recordid><startdate>19970407</startdate><enddate>19970407</enddate><creator>CUI, S. 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| fulltext | fulltext |
| identifier | ISSN: 0953-8984 |
| ispartof | Journal of physics. Condensed matter, 1997-04, Vol.9 (14), p.2891-2902 |
| issn | 0953-8984 1361-648X |
| language | eng |
| recordid | cdi_pascalfrancis_primary_2616135 |
| source | Institute of Physics:Jisc Collections:IOP Publishing Journal Archive 1874-1998 (access period 2020 to 2024); Institute of Physics:Jisc Collections:IOP Publishing Read and Publish 2024-2025 (Reading List) |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Elemental semiconductors and insulators Exact sciences and technology Interface structure and roughness Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | The interface roughness exponent in GexSi1-x/Si superlattices |
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