Structure of Nanocrystalline TiO2 Powders and Precursor to Their Highly Efficient Photosensitizer

• Published in: Chemistry of materials 1997-02, Vol.9 (2), p.430-439
• Main Authors: Shklover, V, Nazeeruddin, M.-K, Zakeeruddin, S. M, Barbé, C, Kay, A, Haibach, T, Steurer, W, Hermann, R, Nissen, H.-U, Grätzel, M
• Format: Article
• Language: English
• Subjects: Chemistry; Clusters, nanoparticles, and nanocrystalline materials; Colloidal state and disperse state; Condensed matter: structure, mechanical and thermal properties; Disperse systems; Exact sciences and technology; General and physical chemistry; Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals; Physics; Powders; Structure and morphology; thickness; Structure of solids and liquids; crystallography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology
• ISSN: 0897-4756; 1520-5002
• DOI: 10.1021/cm950502p

Scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), and X-ray powder diffraction (XRD) studies on nanocrystalline TiO2 powders and thin films are presented. The size, shape (mostly exposed faces), and ordering of the TiO2 anatase particles in the nanocrystalline films are discussed. The use of the topochemical approach, which considers the properties of (nanocrystalline) solids in terms of crystallographic features of (nano)crystals is suggested. The surface area of sensitizer [bis(4,4‘-dicarboxy-2,2‘-bipyridine)bis(thiocyanato)]ruthenium(II) [abbreviated as (cis-Ru(dcbpy)2(NCS)2] on the semiconductor surface for the different types of anchoring is estimated on the basis of single-crystal X-ray diffraction studies of the esterified form of the complex.