Dual-metastability FPGA-based true random number generator

A novel concept of a true random number generator (TNRG) based on two metastable flip-flops in a FPGA circuit is introduced. Most of metastable based TRNG solutions are based on the assumption of a D-latch (flip-flop) state's uncertainty which is the source of randomness. In the proposed approa...

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Bibliographic Details
Published in:Electronics letters 2013-06, Vol.49 (12), p.744-745
Main Author: Wieczorek, P.Z
Format: Article
Language:English
Subjects:
Applied sciences
circuit principle
Circuits and systems
Diehard test
dual‐metastability FPGA‐based true random number generator
Electronics
Exact sciences and technology
field programmable gate arrays
flip‐flops
Integrated circuits
Integrated circuits by function (including memories and processors)
Matlab test
metastable flip‐flops
metastable point
programmable CPLD circuits
programmable FPGA circuits
random number generation
randomness quality‐passing NIST
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
TRNG solution
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Summary:A novel concept of a true random number generator (TNRG) based on two metastable flip-flops in a FPGA circuit is introduced. Most of metastable based TRNG solutions are based on the assumption of a D-latch (flip-flop) state's uncertainty which is the source of randomness. In the proposed approach direct proximity of the metastable point is not necessary. Difference of the time of response of a pair of nearly metastable flip-flops lies upon the proposed circuit's principle of operation. It can be implemented in common programmable FPGA or CPLD circuits ensuring randomness quality-passing NIST, Diehard and Matlab tests.
ISSN:0013-5194
1350-911X
1350-911X
DOI:10.1049/el.2012.4126