Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs : DEFECT AND FAULT TOLERANCE (DFT) IN VLSI AND NANOTECHNOLOGY SYSTEM

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Bibliographic Details
Published in:IEEE transactions on nanotechnology 2013, Vol.12 (4), p.508-517
Main Authors: VALDES-PENA, María D, FERNANDEZ FREIJEDO, Judit, MOURE RODRIGUEZ, María J, RODRIGUEZ-ANDINA, Juan J, SEMIAO, Jorge, CACHO TEIXEIRA, Isabel Maria, CACHO TEIXEIRA, João Paulo, VARGAS, Fabian
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Design. Technologies. Operation analysis. Testing
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
General equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Integrated circuits
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Sensors (chemical, optical, electrical, movement, gas, etc.)
remote sensing
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ISSN:1536-125X
1941-0085