Interface lattice displacement measurement to 1 pm by geometric phase analysis on aberration-corrected HAADF STEM images

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Bibliographic Details
Published in:Acta materialia 2013-09, Vol.61 (15), p.5646-5663
Main Authors: YUANYUAN ZHU, OPHUS, Colin, CISTON, Jim, HAIYAN WANG
Format: Article
Language:English
Subjects:
Applied sciences
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Metals. Metallurgy
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Online Access:Get full text
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ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2013.06.006