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500 °C Bipolar Integrated OR/NOR Gate in 4H-SiC

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Bibliographic Details
Published in:	IEEE electron device letters 2013, Vol.34 (9), p.1091-1093
Main Authors:	LANNI, Luigia, BENGT GUNNAR MALM, ÖSTLING, Mikael, ZETTERLING, Carl-Mikael
Format:	Article
Language:	English
Subjects:	Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors
Online Access:	Get full text
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