Random-Space Dimensionality Reduction for Expedient Yield Estimation of Passive Microwave Structures: SPECIAL ISSUE ON 2013 INTERNATIONAL MICROWAVE SYMPOSIUM. PART II OF TWO PARTS

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2013, Vol.61 (12), p.4313-4321
Main Authors: OCHOA, Juan S, CANGELLARIS, Andreas C
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Frequency filters
Integrated circuits
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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ISSN:0018-9480
1557-9670