Transmission electron microscopy investigation of Bi-based HTS tapes

Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain bo...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1997-06, Vol.7 (2), p.2083-2086
Main Authors: Eastell, C.J., Henry, B.M., Morgan, C.G., Grovenor, C.R.M., Goringe, M.J., Burgoyne, J.W., Dew-Hughes, D.
Format: Article
Language:English
Subjects:
Amorphous materials
Annealing
Applied sciences
Electrical engineering. Electrical power engineering
Exact sciences and technology
Grain boundaries
High temperature superconductors
Materials
Microstructure
Powders
Scanning electron microscopy
Superconducting films
Switches
Transmission electron microscopy
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Summary:Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain boundaries, residual 2212 layers present at grain boundaries and inside grains, and secondary phases. The Ag/superconductor interface has been shown to be relatively planar with no amorphous phases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.621001