Low-temperature Scanning Electron microscopy for low noise studies of High-Tc superconductors

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1997, Vol.7 (2), p.3231-3234
Main Authors: GERBER, R, NISSEL, T, WENER, H.-G, WILLMANN, A, KEIL, S, HÄNSEL, H, HUEBENER, R. P, KOELLE, D, GROSS, R
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Superconducting devices
Online Access:Get full text
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ISSN:1051-8223
1558-2515
DOI:10.1109/77.622036