Critical transistors nexus based circuit-level aging assessment and prediction: Computing with Future Nanotechnology

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Bibliographic Details
Published in:Journal of parallel and distributed computing 2014, Vol.74 (6), p.2512-2520
Main Authors: LAURENCIU, N. Cucu, COTOFANA, S. D
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Integrated circuits
Integrated circuits by function (including memories and processors)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online Access:Get full text
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ISSN:0743-7315
1096-0848