Temperature Sensors to Measure the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers

This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The temperature sensor is embedded in the same silicon die as the PA, and placed in em...

Full description

Saved in:
Bibliographic Details
Published in:IEEE microwave and wireless components letters 2014-04, Vol.24 (4), p.272-274
Main Authors: Altet, J., Mateo, D., Gomez, D., Gonzalez Jimenez, J. L., Martineau, B., Siligaris, A., Aragones, X.
Format: Article
Language:English
Subjects:
Amplifiers
Applied sciences
Bandwidth
Built-in test
Circuit properties
CMOS millimeter wave integrated circuits
design for testability
Design. Technologies. Operation analysis. Testing
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Frequency measurement
frequency response
Gain
Integrated circuits
Low frequencies
Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
Microwaves
Monitoring
Noise levels
Power amplifiers
Radio frequency
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Silicon
Strategy
Temperature measurement
Temperature sensors
Testing, measurement, noise and reliability
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This letter introduces a novel on-chip measurement technique for the determination of the central frequency and 3 dB bandwidth of a 60 GHz power amplifier (PA) by performing low frequency temperature measurements. The temperature sensor is embedded in the same silicon die as the PA, and placed in empty spaces next to it. Results confirm that temperature sensors can be used as functional built-in testers which serve to reduce testing costs and enhance yield as part of self-healing strategies.
ISSN:1531-1309
2771-957X
1558-1764
2771-9588
DOI:10.1109/LMWC.2013.2293668