Planar and Channel Waveguide Structures in CdS Crystals at 633 and 1539 nm

We report on the fabrication and optical properties of planar and channel waveguides in a CdS crystal using a C ion implantation technique combined with a standard photolithographic technique. The prism-coupling and the end-face coupling methods separately measure the guiding modes and the near-fiel...

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Bibliographic Details
Published in:Journal of lightwave technology 2014-07, Vol.32 (14), p.2556-2559
Main Authors: Liu, Tao, Liu, Peng, Zhang, Lian, Zhou, Yu-Fan, Yu, Xiao-Fei, Huang, Qing, Lu, Qing-Ming, Wang, Xue-Lin
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Crystals
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Integrated optics. Optical fibers and wave guides
Microelectronic fabrication (materials and surfaces technology)
Optical and optoelectronic circuits
Optical device fabrication
Optical planar waveguides
Particle beam optics
Planar waveguides
Refractive index
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Summary:We report on the fabrication and optical properties of planar and channel waveguides in a CdS crystal using a C ion implantation technique combined with a standard photolithographic technique. The prism-coupling and the end-face coupling methods separately measure the guiding modes and the near-field intensity distribution of the light at 633 and 1539 nm. The refractive index profiles of the planar and channel waveguides are reconstructed at 633 and 1539 nm. The finite difference beam propagation method is used to simulate the guided mode profiles. There is excellent agreement between the measured and simulated modes at 633 and 1539 nm.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2014.2329060