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An investigation of X-ray reflectivity and diffraction from electroluminescent short-period Si-Ge superlattice structures

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Bibliographic Details
Published in:	Semiconductor science and technology 1995-12, Vol.10 (12), p.1614-1620
Main Authors:	Plotz, W M, Koppensteiner, E, Kibbel, H, Presting, H, Bauer, G, Lischka, K
Format:	Article
Language:	English
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electroluminescence Exact sciences and technology Interface structure and roughness Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other luminescence and radiative recombination Physics Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray diffraction and scattering X-ray reflectometry
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