BLue shift and mirror degradation in InGaAs/GaAs strained quantum well lasers: Reliability physics of advanced electron devices

Saved in:
Bibliographic Details
Published in:Microelectronics and reliability 1996, Vol.36 (7-8), p.1095-1105
Main Authors: SERRA, L, AZZINI, G. A, MONTANGERO, P
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0026-2714
1872-941X