Loading…

Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever

Saved in:

Bibliographic Details
Published in:	Nanotechnology 1994-10, Vol.5 (4), p.199-204
Main Authors:	Chen, Jian, Workman, R K, Sarid, D, Hoper, R
Format:	Article
Language:	English
Subjects:	Atomic force microscopes Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!